Location

  • 1188 Murphy ave, San Jose, CA, USA

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CONSTANT ACCELERATION TESTING

To determine the mechanical limits of the package, internal metallization and lead system, die or substrate attachment, and other elements of the microelectronic device.

This test is used to determine the effects of constant acceleration on microelectronic devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration tests. It may be used as a high stress test to determine the mechanical limits of the package, internal metallization and lead system, die or substrate attachment, and other elements of the microelectronic device. By establishing proper stress levels, it may also be employed as an in-line 100 percent screen to detect and eliminate devices with lower than nominal mechanical strengths in any of the structural elements.